CHIN, Z. H.; BASKARAN, V. M.; ABAEI, G.; TAN, I. K. T.; YAP, T. T. V. Attestation of Improved SimBlock Node Churn Simulation. Journal of Information and Communication Technology, [S. l.], v. 22, n. 2, p. 231–254, 2023. DOI: 10.32890/jict2023.22.2.4. Disponível em: https://e-journal.uum.edu.my/index.php/jict/article/view/16676. Acesso em: 25 apr. 2024.