Chin, Z.H., Baskaran, V.M., Abaei, G., Tan, I.K.T. and Yap, T.T.V. 2023. Attestation of Improved SimBlock Node Churn Simulation. Journal of Information and Communication Technology. 22, 2 (Apr. 2023), 231–254. DOI:https://doi.org/10.32890/jict2023.22.2.4.